Download e-book for iPad: Atomic Force Microscopy Based Nanorobotics: Modelling, by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

By Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

ISBN-10: 3642203280

ISBN-13: 9783642203282

ISBN-10: 3642203299

ISBN-13: 9783642203299

The atomic strength microscope (AFM) has been effectively used to accomplish nanorobotic manipulation operations on nanoscale entities equivalent to debris, nanotubes, nanowires, nanocrystals, and DNA because Nineties.

There were many development on modeling, imaging, teleoperated or automatic keep watch over, human-machine interfacing, instrumentation, and functions of AFM dependent nanorobotic manipulation structures in literature. This ebook goals to incorporate all of such state of the art growth in an equipped, established, and specific demeanour as a reference e-book and likewise almost certainly a textbook in nanorobotics and the other nanoscale dynamics, structures and controls similar examine and schooling.

Clearly written and well-organized, this article introduces designs and prototypes of the nanorobotic platforms intimately with leading edge ideas of third-dimensional manipulation strength microscopy and parallel imaging/manipulation strength microscopy.

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Extra info for Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Example text

On the surface of the glass substrate, a glass microsphere with a diameter of 50µm was glued near the substrate edge used for the point of contact with the piezoresistive cantilever during the force loading. First, the nanopositioning stage was adjusted by 100nm increments until the contact between the piezoresistive cantilever tip and the glass microsphere was achieved. The contact point on the horizontal plane was controlled by microscopy vision, while the Wheatstone bridge voltage output was used to detect the contact on the approaching direction.

Langmuir. 24, 1577–1581 (2008) 16 25. : Measurement of the adhesion force between carbon Nanotubes and a silicon dioxide substrate. Nano Lett. 6, 953–957 (2006) 16 26. : Nanoindentation of silver sanowires. Nano Lett. 3, 1495–1498 (2003) 16 27. : Shear Stress measurements on InAs nanowires by AFM manipulation. Small 3, 1398–1401 (2007) 16 28. : Mechanical properties of ultrahigh-strength gold nanowires. Nature Materials 4, 525–529 (2005) 16 29. : Youngs modulus of ZnO nanobelts measured using atomic force microscopy and nanoindentation techniques.

The experiments described below were performed on a home-built AFM/optical nanomanipulation system under an ambient environment in the air. In the local lateral sensitivity calibration, we translated the laser spot symmetrically around the center of the photodiode with the same range of the photodiode outputs. 23) l0 where l0 is a reference position of the barrier with a photodiode response of about ±120mV deduced by the AFM stage displacement δ z0 . In the experiments, l0 = 8mm was selected and δ z0 = 4µm was decided accordingly.

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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

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