By Villavecchia V.
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Extra info for Treatise On Applied Analytical Chemistry
This recent work indicates that background correction for LEAFS may require measurement of the background signal with a more accurate and precise method than off-line measurements. Several instrumental approaches to background correction for graphite furnace LEAFS have been investigated that include (1) multichannel correction techniques, (2) wavelength background correction and, (3) Zeeman background correction. A. Multichannel Background Correction Techniques Sjtistrt~m (1990a) described a multichannel background correction technique for graphite furnace LEAFS that used three optical fibers located at the exit slit of the monochromator.
1993). (continued) 29 30 DAVID J. BUTCHER o 80C 0 11) (b) 60 0 m :: 40 i,1,,, 11) > = m m mr' 20 0 . . i - - i . 74 . . I . . . . 80 Excitation wavelength, nm Figure 15. (continued) advantage that background correction was made simultaneously with the signal measurement, both signal and background being measured with every laser pulse. Second, this technique can be employed with any atom cell because it involves modification of the detection system. Third, this multichannel method can be used with any laser repetition rate.
BACKGROUND CORRECTION FOR LEAFS Butcher et al. (1988) reviewed the types of background present in graphite furnace LEAFS. These include blackbody emission, laser scatter, molecular fluorescence, and nonanalyte atomic fluorescence. Blackbody emission and laser scatter can be 26 DAVID J. BUTCHER described as broadband background signals, whose magnitude does not vary near the atomic line. Molecular fluorescence and nonanalyte atomic fluorescence may give a structured background whose magnitude changes with wavelength.
Treatise On Applied Analytical Chemistry by Villavecchia V.